microscope

JEM-2100 LaB6 Transmission Electron Microscope

Launched since March 2013, this is a commercial service for advanced materials characterization offering brand new TEM system – JEOL 2100 for both external and internal users.

The state-of-the-art instrument is featuring
  • high-resolution Gatan digital camera with resolution 0.2 nm,
  • dark field (HAADF detector) imaging in STEM mode
  • 3D tomography with high-stability goniometer stage specifically tuned for high tilt tomographic applications
  • EDS elemental analysis with elemental mapping and line scan capability
  • CRYO imaging at -175 oC