JEM-2100 LaB6 Transmission Electron Microscope
Launched since March 2013, this is a commercial service for advanced materials characterization offering brand new TEM system – JEOL 2100 for both external and internal users.
The state-of-the-art instrument is featuring
- high-resolution Gatan digital camera with resolution 0.2 nm,
- dark field (HAADF detector) imaging in STEM mode
- 3D tomography with high-stability goniometer stage specifically tuned for high tilt tomographic applications
- EDS elemental analysis with elemental mapping and line scan capability
- CRYO imaging at -175 oC