{"id":12,"date":"2014-07-03T08:00:59","date_gmt":"2014-07-03T08:00:59","guid":{"rendered":"http:\/\/sites.cardiff.ac.uk\/xpsaccess\/?page_id=12"},"modified":"2016-09-06T11:10:24","modified_gmt":"2016-09-06T11:10:24","slug":"services","status":"publish","type":"page","link":"https:\/\/sites.cardiff.ac.uk\/xpsaccess\/services\/","title":{"rendered":"Services"},"content":{"rendered":"<p class=\"lead\" style=\"text-align: justify\" align=\"center\">The XPS service at Cardiff has a well-established service history that has allowed the development of a high level of surface analysis expertise covering a range of industrial sectors and university research.<\/p>\n<h4 style=\"text-align: justify\" align=\"center\">State of the Art X-ray Photoelectron Spectroscopy Analysis<\/h4>\n<p style=\"text-align: justify\">We offer state of the art XPS analysis through two leading photoelectron spectrometers<\/p>\n<figure class=\"image pull-right\"><img loading=\"lazy\" decoding=\"async\" class=\"\" src=\"http:\/\/sites.cardiff.ac.uk\/xpsaccess\/files\/2014\/07\/kratos1.jpg\" alt=\"kratos1\" width=\"252\" height=\"180\" \/><\/figure>\n<p style=\"text-align: justify\">Our\u00a0<a href=\"http:\/\/www.kratos.com\" target=\"_blank\">Kratos Axis Ultra-DLD<\/a>\u00a0system combines conventional\u00a0X-ray photoelectron spectroscopy (XPS), micro XPS and imaging XPS and is equipped with both monochromatic and \u00a0dual Al-Mg X-ray sources.\u00a0A hemispherical analyser (HSA) provides both high energy resolution and high sensitivity for micro spectroscopy with spatial resolution &lt;15 \u00b5m. With addition of the spherical mirror analyser (SMA), real time chemical state images down to 3 \u00b5m spatial resolution can be obtained in the parallel imaging mode.<\/p>\n<p style=\"text-align: justify\">The spectrometer is equipped with a delay-line detector (DLD), which comprises of\u00a0a multi-channel plate stack above a delay-line anode and used for photoelectron detection in both spectroscopy and imaging modes. The DLD provides <em>ca.<\/em>\u00a010-20 times higher count rate in XPS spectroscopy mode, up to 120 detection channels, parallel spectral acquisition (snapshot mode) capability, and pulse counting parallel XPS imaging capability for lateral distribution of chemical species.<\/p>\n<p style=\"text-align: justify\">Our <a href=\"http:\/\/xpssimplified.com\" target=\"_blank\">Thermo K-alpha<sup>+<\/sup><\/a> system offers a high throughput, rapid analysis system using monochromatic Al radiation. \u00a0A\u00a0new X-ray monochromator allows for the selection of an\u00a0analysis area from 30 \u00b5m to 400 \u00b5m in 5 \u00b5m steps.\u00a0 A new addition to the system\u00a0 (and the first users in the UK) is <a href=\"http:\/\/sites.cardiff.ac.uk\/xpsaccess\/about\/imaging-xps\/\">\u201cSnapMap\u201d imaging<\/a>\u00a0 which allows for rapid aquisition of image data of a surface.<\/p>\n<figure class=\"image pull-right\"><img loading=\"lazy\" decoding=\"async\" src=\"http:\/\/sites.cardiff.ac.uk\/xpsaccess\/files\/2016\/01\/kalpha.png\" alt=\"kalpha\" width=\"252\" height=\"180\" \/><\/figure>\n<p>The analysis area is tuned to the feature of interest to maximize the signal. The high efficiency electron lens, hemispherical analyzer and detector allow for superb detectability, and rapid data acquisition.<\/p>\n<p style=\"text-align: justify\">Charge compensation uses a\u00a0patented dual-beam flood source which couples low energy ion beams with very low energy electrons (less than 1 eV), which prevents sample charging during analysis and aids the analysis of more challenging insulating samples.\u00a0 The K-Alpha<sup>+<\/sup>\u00a0also allows chemical state images of a\u00a0surface. Useful in analyzing small sample features, but capable of imaging a large sample the size of the whole sample stage. The unique optical viewing system offers the opportunity to overlay XPS images with stored camera images, creating powerful tool for identifying and quantifying distributions of surface chemistries.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>The XPS service at Cardiff has a well-established service history that has allowed the development of a high level of surface analysis expertise covering a range of industrial sectors and university research. State of the Art X-ray Photoelectron Spectroscopy Analysis We offer state of the art XPS analysis through two leading photoelectron spectrometers Our\u00a0Kratos Axis<\/p>\n","protected":false},"author":743,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"open","template":"","meta":{"footnotes":""},"class_list":["post-12","page","type-page","status-publish","hentry"],"meta_box":[],"_links":{"self":[{"href":"https:\/\/sites.cardiff.ac.uk\/xpsaccess\/wp-json\/wp\/v2\/pages\/12","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/sites.cardiff.ac.uk\/xpsaccess\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/sites.cardiff.ac.uk\/xpsaccess\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/sites.cardiff.ac.uk\/xpsaccess\/wp-json\/wp\/v2\/users\/743"}],"replies":[{"embeddable":true,"href":"https:\/\/sites.cardiff.ac.uk\/xpsaccess\/wp-json\/wp\/v2\/comments?post=12"}],"version-history":[{"count":24,"href":"https:\/\/sites.cardiff.ac.uk\/xpsaccess\/wp-json\/wp\/v2\/pages\/12\/revisions"}],"predecessor-version":[{"id":376,"href":"https:\/\/sites.cardiff.ac.uk\/xpsaccess\/wp-json\/wp\/v2\/pages\/12\/revisions\/376"}],"wp:attachment":[{"href":"https:\/\/sites.cardiff.ac.uk\/xpsaccess\/wp-json\/wp\/v2\/media?parent=12"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}