Welcome to XPS Analysis at Cardiff
We are pleased to introduce our X-ray Photoelectron Spectroscopy (XPS) surface analysis facility located within the Cardiff Catalysis Institute (CCI)
The Kratos AXIS ULTRA-DLD spectrometer has been supplying the CCI, Cardiff School of Chemistry and industry with high quality XPS analysis since 2006. Combining the next generation of photoelectron detector, the spectrometer also incorporates quantitative, real time parallel imaging with the highest resolution spectroscopy over all analysis areas.
The system integrates the Kratos magnetic immersion lens and charge neutralisation system with dual analysers (spherical mirror and concentric hemispherical analysers). Together with the delay-line detector (DLD) in both imaging and spectroscopy modes, the system provides exceptional results.
The system also boasts a sample treatment cell capable of pressures up to 6 bar and temperatures up to 1000 oC and facilities such as Ion Scattering Spectroscopy, LEED and TPD for single crystal studies.